by Ben Cadwallader | Jan 6, 2026
Features • High speed switching SiC MOSFETs • Reliable body diode • All parts tested to greater than 1,350V • Kelvin reference for stable operation • Press fit terminal connections • Split DC negative terminals Benefits • Low switching losses • Low junction to case...
by Ben Cadwallader | Jan 6, 2026
Features • High speed switching SiC MOSFETs • Reliable body diode • All parts tested to greater than 1,350V • Kelvin reference for stable operation • Press fit terminal connections • Split DC negative terminals Benefits • Low switching losses • Low junction to case...
by Ben Cadwallader | Jan 6, 2026
Features • High speed switching SiC MOSFETs • Reliable body diode • All parts tested to greater than 1,350V • Kelvin reference for stable operation • Press fit terminal connections • Split DC negative terminals Benefits • Low switching losses • Low junction to case...
by Ben Cadwallader | Dec 23, 2025
Features • High speed switching SiC MOSFETs • Reliable body diode • All parts tested to greater than 1,350V • Kelvin reference for stable operation • Press fit terminal connections • Split DC negative terminals Benefits • Low switching losses • Low junction to case...
by Ben Cadwallader | Dec 23, 2025
Features • High speed switching SiC MOSFETs • Reliable body diode • All parts tested to greater than 1,350V • Kelvin reference for stable operation • Press fit terminal connections Benefits • Low switching losses • Low junction to case thermal resistance • Very rugged...